Publicações

An Empirical Study on the Use of Defect Prediction for Test Case Prioritization

AuthID
P-00Q-RH9

Author(s)

Paterson, D

Campos, J

Abreu, R

Kapfhammer, GM

Fraser, G

McMinn, P

Tipo de Documento

Proceedings Paper

Year published

2019

Publicado

in 2019 IEEE 12TH CONFERENCE ON SOFTWARE TESTING, VALIDATION AND VERIFICATION (ICST 2019) in IEEE International Conference on Software Testing Verification and Validation, ISSN: 2381-2834

Páginas: 346-357 (12)

Conference

12Th Ieee International Conference on Software Testing, Verification and Validation (Icst), Date: APR 22-27, 2019, Location: Xian, PEOPLES R CHINA, Patrocinadores: IEEE, IEEE Comp Soc, CCF, Xian Jiaotong Univ, Xian Univ Posts & Telecommunicat, Huawei, Beijing Sunwise Informat Technol Ltd, Baidu, www 360 cn, Netflix, TICPSH, Mooctest, Google

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