Parallel Association of Power Semiconductors: An Experimental Evaluation with Igbts and Mosfets

AuthID
 P-00Q-T9E
6
Author(s)
Sousa, TJC
·
Monteiro, V
·
Nova, B
·
Passos, F
·
Cunha, J
·
Tipo de Documento
Proceedings Paper
Year published
2019
Publicado
in Proceedings - 2019 International Young Engineers Forum, YEF-ECE 2019
Páginas: 8-13
Conference
3Rd International Young Engineers Forum, Yef-Ece 2019, Date: 10 May 2019, Patrocinadores: Faculty of Science and Technology;The Institute of Electrical and Electronics Engineers (IEEE);UNINOVA;Universidade NOVA de Lisboa
Indexing
Scopus®
Crossref®1
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85068461189
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service