An Upgraded Tof-Sims Vg Ionex Ix23Ls: Study on the Negative Secondary Ion Emission of Iii-V Compound Semiconductors with Prior Neutral Cesium Deposition

AuthID
 P-002-DX6
5
Author(s)
Tipo de Documento
Article
Year published
2012
Publicado
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 258, Número: 7, Páginas: 2490-2497 (8)
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-84855541822
Wos: WOS:000299162300045
Source Identifiers
ISSN: 0169-4332
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