Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating

AuthID
 P-00R-CFS
7
Author(s)
Sheikh, M
·
Rajabdorri, M
·
Niknam, T
·
Tipo de Documento
Article
Year published
2019
Publicado
in IEEE SYSTEMS JOURNAL, ISSN: 1932-8184
Volume: 13, Número: 4, Páginas: 3933-3943 (11)
Indexing
Wos®
Scopus®
Dblp®/pt/publications/view/799225
Crossref®37
Google Scholar®
Publication Identifiers
DBLP: journals/sj/SheikhALRNSC19
SCOPUS: 2-s2.0-85074843994
Wos: WOS:000503182300034
Source Identifiers
ISSN: 1932-8184
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service