Formation and Dissociation Reactions of Complexes Involving Interstitial Carbon and Oxygen Defects in Silicon

AuthID
 P-00S-94D
3
Author(s)
Ayedh, HM
·
Monakhov, EV
·
Tipo de Documento
Article
Year published
2020
Publicado
in PHYSICAL REVIEW MATERIALS, ISSN: 2475-9953
Volume: 4, Número: 6
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-85088529446
Wos: WOS:000537212000007
Source Identifiers
ISSN: 2475-9953
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