Classification of Experimental Errors Done in Visir with Simple Alternated Current Circuits

AuthID
P-00S-EYA
7
Author(s)
Mendonca, LN
·
Macaneiro, M
·
Pires, DS
·
Garcia Zumbia, J
·
Cuadros, J
·
3
Editor(es)
Cardoso,A;Alves,GR;Restivo,MT
Tipo de Documento
Proceedings Paper
Year published
2020
Publicado
in PROCEEDINGS OF THE 2020 IEEE GLOBAL ENGINEERING EDUCATION CONFERENCE (EDUCON 2020) in IEEE Global Engineering Education Conference, ISSN: 2165-9567
Volume: 2020-April, Páginas: 1568-1572 (5)
Conference
Ieee Global Engineering Education Conference (Ieee Educon), Date: APR 27-30, 2020, Location: ELECTR NETWORK, Patrocinadores: IEEE, P Porto, U Porto, Univ Coimbra, IEEE Educ Soc, MathWorks, REN, Keysight Technologies, Schweitzer Engn Labs, Rohde & Schwarz, Comtrade, Continental, Symington
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85087868567
Wos: WOS:000617739900236
Source Identifiers
ISSN: 2165-9567
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