Mechanisms of Damage Formation in Eu-Implanted Gan Probed by X-Ray Diffraction

AuthID
 P-002-JZA
6
Author(s)
Lacroix, B
·
Leclerc, S
·
Declemy, A
·
Tipo de Documento
Article
Year published
2011
Publicado
in EPL, ISSN: 0295-5075
Volume: 96, Número: 4, Páginas: 46002 (5)
Indexing
Wos®
Scopus®
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-81155123751
Wos: WOS:000297322500032
Source Identifiers
ISSN: 0295-5075
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