Publicações

Xrd Analysis of Strained Ge-Sige Heterostructures on Relaxed Sige Graded Buffers Grown by Hybrid Epitaxy on Si(001) Substrates

AuthID
P-000-02Y

Author(s)

Franco, N

Barradas, NP

Alves, E

Vallera, AM

Morris, RJH

Mironov, OA

Parker, EHC

Tipo de Documento

Article

Year published

2005

Publicado

in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, ISSN: 0921-5107

Volume: 124, Número: SUPPL., Páginas: 123-126 (4)

Conference

Symposium on Materials Science and Device Issues for Future Si-Based Technologies Held at the 2005 Emrs Meeting, Date: MAY 31-JUN 03, 2005, Location: Strasbourg, FRANCE, Patrocinadores: European Mat Res Soc

Indexing

Wos^®

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Fontes

Publication Identifiers

DOI: 10.1016/j.mseb.2005.08.087

SCOPUS: 2-s2.0-27944476985

Wos: WOS:000233895800019

Source Identifiers

ISSN: 0921-5107

Export Publication Metadata

Lista Marked

Adicionar à lista Marked

Info

At this moment we don't have any links to full text documens.

Xrd Analysis of Strained Ge-Sige Heterostructures on Relaxed Sige Graded Buffers Grown by Hybrid Epitaxy on Si(001) Substrates

Links Úteis

Ajuda

Autenticação Federada (Clique na imagem)

Xrd Analysis of Strained Ge-Sige Heterostructures on Relaxed Sige Graded Buffers Grown by Hybrid Epitaxy on Si(001) Substrates

Links Úteis

Ajuda