Assessment of Doi Resolution in a Fully Mounted Pem Scanner

AuthID
 P-002-W7T
9
Author(s)
Bugalho, R
·
Neves, JA
·
Ortigao, C
·
Oliveira, N
·
Varela, J
·
Almeida, P
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in 2011 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC) in IEEE Nuclear Science Symposium Conference Record, ISSN: 1082-3654
Páginas: 3351-3353 (3)
Conference
Ieee Nuclear Science Symposium/Medical Imaging Conference (Nss/Mic)/18Th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors, Date: OCT 23-29, 2011, Location: Valencia, SPAIN, Patrocinadores: IEEE, Inst Elect & Elect Engineers Nucl & Plasma Sci Soc (IEEE NPSS)
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Publication Identifiers
Wos: WOS:000304755603131
Source Identifiers
ISSN: 1082-3654
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