Examining Different Regimes of Ionization-Induced Damage in Gan Through Atomistic Simulations

AuthID
 P-00X-F56
8
Author(s)
Sequeira, MC
·
Djurabekova, F
·
Nordlund, K
·
Mattei, JG
·
Monnet, I
·
Grygiel, C
·
Alves, E
·
Tipo de Documento
Article in Press
Year published
2022
Publicado
in SMALL, ISSN: 1613-6810
Volume: 18, Número: 49
Indexing
Wos®
Scopus®
Crossref®4
Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 36310127
SCOPUS: 2-s2.0-85141165482
Wos: WOS:000876133900001
Source Identifiers
ISSN: 1613-6810
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