Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing

AuthID
 P-00X-P59
4
Author(s)
Tipo de Documento
Article
Year published
2023
Publicado
in SENSORS, ISSN: 1424-8220
Volume: 23, Número: 1, Páginas: 325 (22)
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Scopus®
Dblp®/pt/publications/view/972969
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Publication Identifiers
DBLP: journals/sensors/SilvaVLM23
Pubmed: 36616930
SCOPUS: 2-s2.0-85145972253
Unpaywall: 10.3390/s23010325
Wos: WOS:000910237700001
Source Identifiers
ISSN: 1424-8220
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