Measuring Improvement of F1-Scores in Detection of Self-Admitted Technical Debt

AuthID
 P-00Y-5MH
6
Author(s)
Aiken, W
·
Mvula, PK
·
Jourdan, GV
·
Sabetzadeh, M
·
Viktor, HL
Tipo de Documento
Proceedings Paper
Year published
2023
Publicado
in 2023 ACM/IEEE International Conference on Technical Debt (TechDebt), Melbourne, Australia, May 14-15, 2023 in TechDebt@ICSE
Páginas: 37-41
Indexing
Dblp®/pt/publications/view/988817
Publication Identifiers
DBLP: conf/techdebt/AikenMBJSV23
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