Publications

Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

AuthID
P-000-255

Author(s)

Burros, D

Rodriguez Irago, M

Santos, MB

Teixeira, IC

Vargas, F

Teixeira, JP

Document Type

Article

Year published

2005

Published

in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174

Volume: 21, Issue: 4, Pages: 349-363 (15)

Conference

10Th Ieee International On-Line Testing Symposium, Date: JUL 12-14, 2004, Location: Funchal, PORTUGAL, Sponsors: IEEE Comp Soc, Test Technol Tech Council

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Publication Identifiers

DOI: 10.1007/s10836-005-0972-z

Scopus: 2-s2.0-23944526350

Wos: WOS:000230649300003

Source Identifiers

ISSN: 0923-8174

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