Publications

AuthID
P-000-96Y

Author(s)

Manich, S

Balado, L

Figueras, J

Document Type

Article

Year published

2004

Published

in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174

Volume: 20, Issue: 4, Pages: 345-355 (11)

Conference

3Rd Ieee Latin-American Test Workshop, Date: 2002, Location: Montevideo, URUGUAY, Sponsors: IEEE

Indexing

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Publication Identifiers

DOI: 10.1023/b:jett.0000039603.89172.2e

SCOPUS: 2-s2.0-4444319505

Wos: WOS:000223553500004

Source Identifiers

ISSN: 0923-8174

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