Rtl-Based Functional Test Generation for High Defects Coverage in Digital Socs

AuthID
 P-001-1MK
4
Author(s)
Document Type
Proceedings Paper
Year published
2000
Published
in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
Pages: 99-104 (6)
Conference
Ieee European Test Workshop, Date: MAY 23-26, 2000, Location: CASCAIS, PORTUGAL, Sponsors: IEEE Comp Soc, Test Technol Tech Council, Lisbon Tech Univ, Elect & Comp Engn Dept
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Wos: WOS:000089739600014
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