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Built-In Aging Monitoring for Safety-Critical Applications
AuthID
P-003-SJ5
7
Author(s)
Vazquez, JC
·
Champac, V
·
Ziesemer, AM
·
Reis, R
·
Teixeira, IC
·
Santos, MB
·
Teixeira, JP
3
Editor(s)
Chatterjee, A; Nicolaidis, M; Santos, M
Document Type
Proceedings Paper
Year published
2009
Published
in
2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
in
IEEE International On-Line Testing Symposium,
ISSN: 1942-9398
Pages: 9-14 (6)
Conference
15Th Ieee International On-Line Testing Symposium,
Date:
JUN 24-26, 2009,
Location:
Sesimbra, PORTUGAL,
Sponsors:
IEEE
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/iolts.2009.5195976
SCOPUS
: 2-s2.0-70449455921
Wos
: WOS:000272962700002
Source Identifiers
ISSN
: 1942-9398
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