Exploiting Parametric Power Supply And/Or Temperature Variations to Improve Fault Tolerance in Digital Circuits

AuthID
 P-004-53E
7
Author(s)
4
Editor(s)
Gizopoulos, D; Seifert, N; Nicolaidis, M; Paschalis, A
Document Type
Proceedings Paper
Year published
2008
Published
in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS in IEEE International On-Line Testing Symposium, ISSN: 1942-9398
Pages: 227-232 (6)
Conference
14Th Ieee International On-Line Testing Symposium, Date: JUL 06-09, 2008, Location: Rhodes, GREECE, Sponsors: IEEE Comp Soc, Test Technol Tech Council, Univ Athens, Univ Piraeus, TIMA Lab
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-52049084093
Wos: WOS:000257879900042
Source Identifiers
ISSN: 1942-9398
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service