Publications

Low-Sensitivity to Process Variations Aging Sensor for Automotive Safety-Critical Applications

AuthID
P-007-TMD

Author(s)

Vazquez, JC

Champac, V

Ziesemer, AM

Reis, R

Teixeira, IC

Santos, MB

Teixeira, JP

Document Type

Proceedings Paper

Year published

2010

Published

in Proceedings of the IEEE VLSI Test Symposium

Pages: 238-243

Conference

28Th Ieee Vlsi Test Symposium, Vts10, Date: 19 April 2010 through 22 April 2010, Location: Santa Cruz, CA, Sponsors: IEEE Computer Society Test Technology Technical Council

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Publication Identifiers

DOI: 10.1109/vts.2010.5469568

SCOPUS: 2-s2.0-77953883911

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Low-Sensitivity to Process Variations Aging Sensor for Automotive Safety-Critical Applications

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