in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, ISSN: 1550-5774
Pages: 110-115
Conference
27Th Ieee International Symposium on Defect and Fault Tolerance in Vlsi and Nanotechnology Systems, Dft 2014, Date: 1 October 2014 through 3 October 2014, Sponsors: IEEE Computer Society;IEEE Fault-Tolerant Computing Technical Committee;IEEE Test Technology Technical Council (TTTC)