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Fault-Tolerance in Fpga Focusing Power Reduction or Performance Enhancement
AuthID
P-00G-CVT
5
Author(s)
Leong, C
·
Semiao, J
·
Santos, MB
·
Teixeira, IC
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
2015
Published
in
2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS)
Conference
16Th Ieee Latin American Test Symposium (Lats),
Date:
MAR 25-27, 2015,
Location:
Puerto Vallarta, MEXICO,
Sponsors:
IEEE, Natl Inst Astrophys Opt Electron, Test Technol Techn Council, IEEE Council Electron Design Automat
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Publication Identifiers
DOI
:
10.1109/latw.2015.7102523
Scopus
: 2-s2.0-84933575114
Wos
: WOS:000380400700043
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