Fault-Tolerance in Fpga Focusing Power Reduction or Performance Enhancement

AuthID
 P-00G-CVT
5
Author(s)
Document Type
Proceedings Paper
Year published
2015
Published
in 2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS)
Conference
16Th Ieee Latin American Test Symposium (Lats), Date: MAR 25-27, 2015, Location: Puerto Vallarta, MEXICO, Sponsors: IEEE, Natl Inst Astrophys Opt Electron, Test Technol Techn Council, IEEE Council Electron Design Automat
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Publication Identifiers
SCOPUS: 2-s2.0-84933575114
Wos: WOS:000380400700043
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