Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

AuthID
 P-00H-4HS
6
Author(s)
Júnior, DB
·
Vargas, F
·
Document Type
Article
Year published
2005
Published
in J Electron Test - Journal of Electronic Testing, ISSN: 0923-8174
Volume: 21, Issue: 4, Pages: 349-363
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ISSN: 0923-8174
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