Manuel Armando Oliveira Pereira dos Santos


AuthID: R-000-A1H

Confirmed Publications: 33



11
TITLE: Residual stress effects on Raman spectra of RuO2 thin films
AUTHORS: Meng, LJ ; Silva, R ; Cui, HN; Teixeira, V ; dos Santos, MP ;
PUBLISHED: 2005, SOURCE: 7th International Conference onResidual Strsses (ICRS-7) in RESIDUAL STRESSES VII, PROCEEDINGS, VOLUME: 490-491
INDEXED IN: Scopus WOS
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12
TITLE: Raman spectroscopy analysis of magnetron sputtered RuO2 thin films  Full Text
AUTHORS: Meng, LJ ; Teixeira, V ; dos Santos, MP ;
PUBLISHED: 2003, SOURCE: 4th International Conference on Coatings on Glass in THIN SOLID FILMS, VOLUME: 442, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
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13
TITLE: The calculation of the optical constants of indium-tin-oxide films
AUTHORS: Meng, LJ; Placido, F; Teixeira, V; dos Santos, MP ;
PUBLISHED: 2003, SOURCE: 9th International Conference on Enhancement and Promotion of Computational Methods in Engineering and Science in COMPUTATIONAL METHODS IN ENGINEERING AND SCIENCE, PROCEEDINGS
INDEXED IN: WOS
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14
TITLE: Study of ZrO2/Al2O3 multilayers  Full Text
AUTHORS: Gao, PT; Meng, LJ ; dos Santos, MP ; Teixeira, V ; Andritschky, M ;
PUBLISHED: 2002, SOURCE: 4th Iberian Vacuum Meeting (IVM-4) in VACUUM, VOLUME: 64, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
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15
TITLE: Influence of sputtering pressure on the structure and properties of ZrO2 films prepared by rf reactive sputtering  Full Text
AUTHORS: Gao, PT; Meng, LJ ; dos Santos, MP ; Teixeira, V ; Andritschky, M ;
PUBLISHED: 2001, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 173, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
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16
TITLE: A study of residual stress on rf reactively sputtered RuO2 thin films  Full Text
AUTHORS: Meng, LJ ; dos Santos, MP ;
PUBLISHED: 2000, SOURCE: International-Union-of-Materials-Research-Societies International Conference on Advanced Materials (IUMRS-ICAM 99) in THIN SOLID FILMS, VOLUME: 375, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
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17
18
TITLE: Influence of sputtering power and the substrate-target distance on the properties of ZrO2 films prepared by RF reactive sputtering  Full Text
AUTHORS: Gao, PT; Meng, LJ ; dos Santos, MP ; Teixeira, V ; Andritschky, M ;
PUBLISHED: 2000, SOURCE: 27th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 377
INDEXED IN: Scopus WOS CrossRef
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19
TITLE: Influence of the target-substrate distance on the properties of indium tin oxide films prepared by radio frequency reactive magnetron sputtering
AUTHORS: Meng, LJ ; dos Santos, MP ;
PUBLISHED: 2000, SOURCE: 46th National Symposium of the American-Vacuum-Society in JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, VOLUME: 18, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
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20
TITLE: Study of ZrO2-Y2O3 films prepared by rf magnetron reactive sputtering  Full Text
AUTHORS: Gao, PT; Meng, LJ ; dos Santos, MP ; Teixeira, V ; Andritschky, M ;
PUBLISHED: 2000, SOURCE: 27th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 377
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
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