Marcelino Bicho dos Santos


AuthID: R-000-A9P

Confirmed Publications: 82



61
TITLE: A probabilistic method for the computation of testability of RTL constructs
AUTHORS: Fernandes, JM; Santos, MB ; Oliveira, AL ; Teixeira, JC;
PUBLISHED: 2004, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 04) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, VOLUME: 1
INDEXED IN: Scopus WOS DBLP CrossRef: 7
IN MY: ORCID | ResearcherID
62
TITLE: Built-in self-test quality assessment using hardware fault emulation in FPGAs
AUTHORS: Parreira, A; Teixeira, JP ; Santos, MB ;
PUBLISHED: 2004, SOURCE: IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in COMPUTING AND INFORMATICS, VOLUME: 23, ISSUE: 5-6
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
63
TITLE: FPGAs BIST evaluation
AUTHORS: Parreira, A; Teixeira, JP ; Santos, MB ;
PUBLISHED: 2004, SOURCE: 14th International Conference on Field-Programmable Logic and Applications in FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS, VOLUME: 3203
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
64
TITLE: Modeling and simulation of time domain faults in digital systems
AUTHORS: Junior, DB; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2004, SOURCE: Proceedings - 10th IEEE International On-Line Testing Symposium, IOLTS 2004 in Proceedings - 10th IEEE International On-Line Testing Symposium, IOLTS 2004
INDEXED IN: Scopus
IN MY: ORCID
65
TITLE: On high-quality, low energy built-in self test preparation at RT-level  Full Text
AUTHORS: Santos, MB ; Teixeira, IC ; Teixeira, JP ; Manich, S; Balado, L; Figueras, J;
PUBLISHED: 2004, SOURCE: 3rd IEEE Latin-American Test Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 20, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
66
TITLE: Overview of the ECAL off-detector electronics of the CMS experiment
AUTHORS: Alemany, R; Almeida, CB ; Almeida, N; Bercher, M; Benetta, R; Bexiga, V; Bourotte, J; Busson, P; Cardoso, N; Cerrutti, M; Dejardin, M; Faure, JL; Gachelin, O; Gastal, M; Geerebaert, Y; Gilly, J; Gras, P; Hansen, M; Husejko, M; Jain, A; Karar, A; Kloukinas, K; Ljuslin, C; Machado, R; Manjavidze, I; Mur, M; Paganini, P; Regnault, N; Santos, M ; Silva, JCD; Teixeira, I ; Teixeira, JP ; Varela, J ; Verrecchia, P; Zlatevski, L; ...More
PUBLISHED: 2004, SOURCE: Nuclear Science Symposium/Medical Imaging Conference in 2004 IEEE Nuclear Science Symposium Conference Record, Vols 1-7, VOLUME: 2
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
67
TITLE: Effectiveness of low-cost thermal vacuum test of micro-satellites
AUTHORS: Almeida, JS; Santos, MB ; Panissi, D; Garcia, EC;
PUBLISHED: 2003, SOURCE: 54th International Astronautical Congress of the International Astronautical Federation (IAF), the International Academy of Astronautics and the International Institute of Space Law in 54th International Astronautical Congress of the International Astronautical Federation (IAF), the International Academy of Astronautics and the International Institute of Space Law, VOLUME: 1
INDEXED IN: Scopus
IN MY: ORCID
68
TITLE: Design and test of a certifiable ASIC for a safety-critical gas burner control system  Full Text
AUTHORS: Goncalves, FM ; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: 7th IEEE International On-Line Testing Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID | ResearcherID
69
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage  Full Text
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: IEEE European Test Workshop (ETW 01) in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
70
TITLE: RTL level preparation of high-quality/low-energy/low-power BIST
AUTHORS: Santos, MB ; Teixeira, IC ; Teixeira, JP ; Manich, S; Rodriguez, R; Figueras, J;
PUBLISHED: 2002, SOURCE: International Test Conference in INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
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