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Jorge Filipe Leal Costa Semião
AuthID:
R-001-F67
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (47)
Article (12)
Book Chapter (4)
Book (1)
Review (1)
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Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
Title Asc
Title Dsc
Results:
10
20
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50
Confirmed Publications: 65
21
TITLE:
Fast radiation monitoring in FPGA-based designs
AUTHORS:
Leong, C;
Jorge Semião
; M.B Santos; I.C Teixeira; J.P Teixeira; A.J.N Batista;
Goncalves, B
; J.G Marques;
PUBLISHED:
2015
,
SOURCE:
2015 Conference on Design of Circuits and Integrated Systems (DCIS)
INDEXED IN:
CrossRef
IN MY:
ORCID
22
TITLE:
Fast Radiation Monitoring in FPGA-based Designs
AUTHORS:
Leong, C
;
Jorge Semião
;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
Batista, AJN
;
Goncalves, B
;
Marques, JG
;
PUBLISHED:
2015
,
SOURCE:
2015 Conference on Design of Circuits and Integrated Systems (DCIS)
in
2015 Conference on Design of Circuits and Integrated Systems (DCIS)
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
23
TITLE:
Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling
AUTHORS:
Leong, C
;
Jorge Semião
;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2015
,
SOURCE:
JOURNAL OF LOW POWER ELECTRONICS,
VOLUME:
11,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
24
TITLE:
Fault-Tolerance in FPGA Focusing Power Reduction or Performance Enhancement
AUTHORS:
Leong, C
;
Jorge Semião
;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2015
,
SOURCE:
16th IEEE Latin American Test Symposium (LATS)
in
2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
25
TITLE:
Integration of a Food Distribution Routing Optimization Software with an Enterprise Resource Planner
AUTHORS:
Pedro J S Cardoso
;
Gabriela Schutz
;
Jorge Semião
;
Janio Monteiro
;
Joao Rodrigues
;
Andriy Mazayev
;
Emanuel Ey
;
Micael Viegas
;
Carlos Neves
;
Sergio Anastacio
;
PUBLISHED:
2015
,
SOURCE:
1st International Conference on Geographical Information Systems Theory, Applications and Management (GISTAM)
in
2015 1ST INTERNATIONAL CONFERENCE ON GEOGRAPHICAL INFORMATION SYSTEMS THEORY, APPLICATIONS AND MANAGEMENT (GISTAM)
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
IN MY:
ORCID
26
TITLE:
A Distributed Load Scheduling Mechanism for Micro Grids
AUTHORS:
Janio Monteiro
; Jorge Eduardo;
Pedro J S Cardoso
;
Jorge Semião
;
PUBLISHED:
2014
,
SOURCE:
2014 IEEE International Conference on Smart Grid Communications (SmartGridComm)
in
2014 IEEE INTERNATIONAL CONFERENCE ON SMART GRID COMMUNICATIONS (SMARTGRIDCOMM)
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
5
IN MY:
ORCID
27
TITLE:
Aging-aware dynamic voltage or frequency scaling
AUTHORS:
Jorge Semião
; Leong, C; Romao, A;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2014
,
SOURCE:
2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014
in
Proceedings of the 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014
INDEXED IN:
Scopus
CrossRef
:
1
IN MY:
ORCID
28
TITLE:
AGING MONITORING WITH LOCAL SENSORS IN FPGA-BASED DESIGNS
AUTHORS:
Leong, C
;
Jorge Semião
;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
; Valdes, M;
Freijedo, J
; Rodriguez Andina, JJ;
Vargas, F
;
PUBLISHED:
2013
,
SOURCE:
23rd International Conference on Field Programmable Logic and Applications (FPL)
in
2013 23RD INTERNATIONAL CONFERENCE ON FIELD PROGRAMMABLE LOGIC AND APPLICATIONS (FPL 2013) PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
29
TITLE:
Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs
AUTHORS:
Maria D Valdes Pena;
Judit F Fernandez Freijedo
; Maria J M Moure Rodriguez; Juan J Rodriguez Andina;
Jorge Semião
;
Isabel Maria C Cacho Teixeira
;
Joao Paulo C Cacho Teixeira
;
Fabian Vargas
;
PUBLISHED:
2013
,
SOURCE:
IEEE TRANSACTIONS ON NANOTECHNOLOGY,
VOLUME:
12,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
30
TITLE:
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion
Full Text
AUTHORS:
Vazquez, JC; Champac, V;
Jorge Semião
;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
;
PUBLISHED:
2013
,
SOURCE:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
VOLUME:
29,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
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