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Isabel Maria Silva Nobre Parreira Cacho Teixeira
AuthID:
R-000-6DS
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (62)
Article (32)
Article in Press (2)
Editorial Material (1)
Review (1)
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Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Title Dsc
Results:
10
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Confirmed Publications: 98
21
TITLE:
Built-in Clock Domain Crossing (CDC) test and diagnosis in GALS systems
AUTHORS:
Leong, C
;
Machado, P
;
Bexiga, V
;
Teixeira, JP
;
Teixeira, IC
; Silva, JC; Lousa, P;
Varela, J
;
PUBLISHED:
2010
,
SOURCE:
13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010
in
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
22
TITLE:
Delay modeling for power noise-aware design in Spartan-3A FPGAS
AUTHORS:
Freijedo, JF
; Valdes, MD; Moure, MJ; Costas, L; Rodriguez Andina, JJ;
Jorge Semião
; Vargas, F;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2010
,
SOURCE:
6th Southern Programmable Logic Conference, SPL 2010
in
6th Southern Programmable Logic Conference, SPL 2010 - Proceedings
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
23
TITLE:
Impact of power supply voltage variations on FPGA-based digital systems performance
AUTHORS:
Freijedo, J
; Costas, L;
Jorge Semião
; Rodriguez Andina, JJ; Moure, MJ;
Vargas, F
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2010
,
SOURCE:
Journal of Low Power Electronics,
VOLUME:
6,
ISSUE:
2
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
24
TITLE:
Investigating the use of BICS to detect resistive- open defects in SRAMs
AUTHORS:
Chipana, R; Bolzani, L; Vargas, F;
Jorge Semião
; Rodriguez Andina, J;
Teixeira, I
;
Teixeira, P
;
PUBLISHED:
2010
,
SOURCE:
16th IEEE International On-Line Testing Symposium, IOLTS 2010
in
Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
25
TITLE:
Low-sensitivity to process variations aging sensor for automotive safety-critical applications
AUTHORS:
Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
;
PUBLISHED:
2010
,
SOURCE:
28th IEEE VLSI Test Symposium, VTS10
in
Proceedings of the IEEE VLSI Test Symposium
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
26
TITLE:
Predictive error detection by on-line aging monitoring
AUTHORS:
Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R;
Jorge Semião
;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
;
PUBLISHED:
2010
,
SOURCE:
16th IEEE International On-Line Testing Symposium, IOLTS 2010
in
Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
27
TITLE:
Programmable aging sensor for automotive safety-critical applications
AUTHORS:
Vazquez, JC; Champac, V;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
;
PUBLISHED:
2010
,
SOURCE:
Design, Automation and Test in Europe Conference and Exhibition, DATE 2010
in
Proceedings -Design, Automation and Test in Europe, DATE
INDEXED IN:
Scopus
IN MY:
ORCID
28
TITLE:
Built-In Aging Monitoring for Safety-Critical Applications
Full Text
AUTHORS:
Vazquez, JC; Champac, V; Ziesemer, AM;
Reis, R
;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
;
PUBLISHED:
2009
,
SOURCE:
15th IEEE International On-Line Testing Symposium
in
2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
29
TITLE:
Characterization of the Clear-PEM Breast Imaging Scanner Performance
AUTHORS:
Albuquerque, E
;
Almeida, FG
;
Almeida, P
; Auffray, E;
Barbosa, J
; Bastos, AL;
Bexiga, V
;
Bugalho, R
; Cardoso, C; Carmona, S;
Carneiro, JF
; Carrico, B;
Ferreira, CS
;
Ferreira, NC
;
Ferreira, M
; Frade, M;
Goncalves, F
; Guerreiro, C; Lecoq, P;
Leong, C
;
Lousa, P;
Machado, P
;
Martins, MV;
Matela, N
;
Moura, R;
Neves, J;
Neves, P;
Oliveira, N;
Ortigao, C
;
Piedade, F;
Pinheiro, JF;
Relvas, P
;
Rivetti, A;
Rodrigues, P
;
Rolo, I;
Santos, AI
;
Santos, J;
Silva, MM
;
Tavernier, S;
Teixeira, IC
;
Teixeira, JP
;
Silva, JC
;
Silva, R
;
Trindade, A;
Varela, J
;
Bento, P;
...More
PUBLISHED:
2009
,
SOURCE:
IEEE Nuclear Science Symposium Conference 2009
in
2009 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-5
INDEXED IN:
Scopus
WOS
CrossRef
:
5
IN MY:
ORCID
30
TITLE:
DATA ACQUISITION ELECTRONICS FOR PET MAMMOGRAPHY IMAGING
AUTHORS:
Carlos Leong
; Pedro Machado; Vasco Bexiga;
Paulo P Teixeira
;
Isabel C Teixeira
;
Joel Rego
; Pedro Neves; Fernando Piedade; Pedro Lousa;
Pedro Rodrigues
;
Andreia Trindade
; Bugalho, R; Pinheiro, JF;
Ferreira, M
;
Joao Varela
;
PUBLISHED:
2009
,
SOURCE:
2nd International Conference on Biomedical Electronics and Devices
in
BIODEVICES 2009: PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON BIOMEDICAL ELECTRONICS AND DEVICES
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
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