Mercedes Vila Juárez
AuthID: R-000-J5B
51
TITLE: Residual stresses in ceramic-to-metal joints: Diffraction measurements and finite element method analysis Full Text
AUTHORS: Vila, M; Prieto, C; Zahr, J; Perez Castellanos, JL; Bruno, G; Jimenez Ruiz, M; Miranzo, P; Osendi, MI;
PUBLISHED: 2007, SOURCE: Philosophical Magazine, VOLUME: 87, ISSUE: 35
AUTHORS: Vila, M; Prieto, C; Zahr, J; Perez Castellanos, JL; Bruno, G; Jimenez Ruiz, M; Miranzo, P; Osendi, MI;
PUBLISHED: 2007, SOURCE: Philosophical Magazine, VOLUME: 87, ISSUE: 35
52
TITLE: Brillouin light scattering characterization of the surface acoustic wave velocity in the ZnO/ Si3N4 /Si(100) system
AUTHORS: Cespedes, E; Jimenez Rioboo, RJ; Vila, M; Prieto, C;
PUBLISHED: 2006, SOURCE: E-MRS 2005 Symposium G: ZnO and Related Materials Part 2 in Superlattices and Microstructures, VOLUME: 39, ISSUE: 1-4
AUTHORS: Cespedes, E; Jimenez Rioboo, RJ; Vila, M; Prieto, C;
PUBLISHED: 2006, SOURCE: E-MRS 2005 Symposium G: ZnO and Related Materials Part 2 in Superlattices and Microstructures, VOLUME: 39, ISSUE: 1-4
INDEXED IN: 
Scopus
Scopus IN MY: 
ORCID
ORCID53
TITLE: Brillouin light scattering characterization of the surface acoustic wave velocity in the ZnO/ Si3N4 /Si(100) system Full Text
AUTHORS: Céspedes, E; R.J Jiménez-Riobóo; Vila, M; Prieto, C;
PUBLISHED: 2006, SOURCE: Superlattices and Microstructures, VOLUME: 39, ISSUE: 1-4
AUTHORS: Céspedes, E; R.J Jiménez-Riobóo; Vila, M; Prieto, C;
PUBLISHED: 2006, SOURCE: Superlattices and Microstructures, VOLUME: 39, ISSUE: 1-4
54
TITLE: Electrical conduction mechanism in silicon nitride and oxy-nitride- sputtered thin films Full Text
AUTHORS: Vila, M; Roman, E; Prieto, C;
PUBLISHED: 2005, SOURCE: Journal of Applied Physics, VOLUME: 97, ISSUE: 11
AUTHORS: Vila, M; Roman, E; Prieto, C;
PUBLISHED: 2005, SOURCE: Journal of Applied Physics, VOLUME: 97, ISSUE: 11
55
TITLE: High energy X-ray diffraction analysis of strain and residual stress in silicon nitride ceramic diffusion bonds Full Text
AUTHORS: Vila, M; Prieto, C; Miranzo, P; Osendi, MI; Terry, AE; Vaughan, GBM;
PUBLISHED: 2005, SOURCE: Synchrotron Radiation in Materials Science Proceedings of the 4th Conference on Synchrotron Radiation in Materials Science in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 238, ISSUE: 1-4
AUTHORS: Vila, M; Prieto, C; Miranzo, P; Osendi, MI; Terry, AE; Vaughan, GBM;
PUBLISHED: 2005, SOURCE: Synchrotron Radiation in Materials Science Proceedings of the 4th Conference on Synchrotron Radiation in Materials Science in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 238, ISSUE: 1-4
56
TITLE: Measurements and finite-element simulations of residual stresses developed in Si3N4/Ni diffusion bonds Full Text
AUTHORS: Vila, M; Prieto, C; Miranzo, P; Osendi, MI; Del Rio, JM; Perez Castellanos, JL;
PUBLISHED: 2005, SOURCE: Journal of the American Ceramic Society, VOLUME: 88, ISSUE: 9
AUTHORS: Vila, M; Prieto, C; Miranzo, P; Osendi, MI; Del Rio, JM; Perez Castellanos, JL;
PUBLISHED: 2005, SOURCE: Journal of the American Ceramic Society, VOLUME: 88, ISSUE: 9
57
TITLE: Effect of deposition temperature on surface acoustic wave velocity of aluminum nitride films determined by Brillouin spectroscopy Full Text
AUTHORS: Assouar, MB; Rioboo, RJJ; Vila, M; Alnot, P;
PUBLISHED: 2005, SOURCE: Journal of Applied Physics, VOLUME: 98, ISSUE: 9
AUTHORS: Assouar, MB; Rioboo, RJJ; Vila, M; Alnot, P;
PUBLISHED: 2005, SOURCE: Journal of Applied Physics, VOLUME: 98, ISSUE: 9
58
TITLE: EXAFS characterization of nickel clusters in Ni/Si3N4 sputtered thin films
AUTHORS: Vila, M; Jimenez Villacorta, F; Prieto, C; Traverse, A;
PUBLISHED: 2005, SOURCE: 12th X-ray Absorption Fine Structure International Conference, XAFS12 in Physica Scripta T, VOLUME: T115
AUTHORS: Vila, M; Jimenez Villacorta, F; Prieto, C; Traverse, A;
PUBLISHED: 2005, SOURCE: 12th X-ray Absorption Fine Structure International Conference, XAFS12 in Physica Scripta T, VOLUME: T115
59
TITLE: Effect of sputtering rate and ion irradiation on the microstructure and magnetic properties of Ni Si3 N4 multilayers Full Text
AUTHORS: Vila, M; Prieto, C; Traverse, A; Ramirez, R;
PUBLISHED: 2005, SOURCE: Journal of Applied Physics, VOLUME: 98, ISSUE: 11
AUTHORS: Vila, M; Prieto, C; Traverse, A; Ramirez, R;
PUBLISHED: 2005, SOURCE: Journal of Applied Physics, VOLUME: 98, ISSUE: 11
60
TITLE: EXAFS and XRD characterization of iron thin films prepared by sputtering at very low temperatures
AUTHORS: Jimenez Villacorta, F; Munoz Martin, A; Vila, M; Prieto, C; Traverse, A;
PUBLISHED: 2005, SOURCE: 12th X-ray Absorption Fine Structure International Conference, XAFS12 in Physica Scripta T, VOLUME: T115
AUTHORS: Jimenez Villacorta, F; Munoz Martin, A; Vila, M; Prieto, C; Traverse, A;
PUBLISHED: 2005, SOURCE: 12th X-ray Absorption Fine Structure International Conference, XAFS12 in Physica Scripta T, VOLUME: T115
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID