Alexander Tolstoguzov
AuthID: R-000-V7T
101
TITLE: MARISS study on ion yields of Ne<SUP>+</SUP> scattered from III-V compound semiconductors
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C;
PUBLISHED: 2004, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 217, ISSUE: 2
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C;
PUBLISHED: 2004, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 217, ISSUE: 2
102
TITLE: Dependence of Ne+ scattered ion yield on incident energy for surfaces of pure gallium and indium
AUTHORS: Tolstoguzov, AB; Daolio, S; Pagura, C;
PUBLISHED: 2004, SOURCE: Izvestiya Akademii Nauk. Ser. Fizicheskaya, VOLUME: 68, ISSUE: 3
AUTHORS: Tolstoguzov, AB; Daolio, S; Pagura, C;
PUBLISHED: 2004, SOURCE: Izvestiya Akademii Nauk. Ser. Fizicheskaya, VOLUME: 68, ISSUE: 3
INDEXED IN: 
Scopus
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ORCID
ORCID103
TITLE: Preparation of microobjects with application of high-pure indium for SIMS analysis
AUTHORS: Kitaeva, TI; Tolstoguzov, AB; Trunin, EB; Trunina, OE;
PUBLISHED: 2004, SOURCE: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, ISSUE: 8
AUTHORS: Kitaeva, TI; Tolstoguzov, AB; Trunin, EB; Trunina, OE;
PUBLISHED: 2004, SOURCE: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, ISSUE: 8
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID104
TITLE: Characterization of Al+ secondary ion emission produced by Ne+ and Ar+ bombardment of aluminium surface
AUTHORS: Tolstogouzov, A; Belykh, SF; Stepanova, M; Dew, SK; Pagura, C;
PUBLISHED: 2004, SOURCE: Surface Review and Letters, VOLUME: 11, ISSUE: 4-5
AUTHORS: Tolstogouzov, A; Belykh, SF; Stepanova, M; Dew, SK; Pagura, C;
PUBLISHED: 2004, SOURCE: Surface Review and Letters, VOLUME: 11, ISSUE: 4-5
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID105
TITLE: CHARACTERIZATION OF Al + SECONDARY ION EMISSION PRODUCED BY Ne + AND Ar + BOMBARDMENT OF ALUMINIUM SURFACE Full Text
AUTHORS: TOLSTOGOUZOV, A; BELYKH, SF; STEPANOVA, M; DEW, SK; PAGURA, C;
PUBLISHED: 2004, SOURCE: Surf. Rev. Lett. - Surface Review and Letters, VOLUME: 11, ISSUE: 04n05
AUTHORS: TOLSTOGOUZOV, A; BELYKH, SF; STEPANOVA, M; DEW, SK; PAGURA, C;
PUBLISHED: 2004, SOURCE: Surf. Rev. Lett. - Surface Review and Letters, VOLUME: 11, ISSUE: 04n05
INDEXED IN: 
CrossRef
CrossRef106
TITLE: Energy distributions of Ga+ and In+ secondary ions sputtered from AIIIBV compound semiconductors by noble gas ions: Mass-dependence of the high-energy yield on the second component (P, As, Sb) of the compounds Full Text
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL; Karpuzov, DS; McIntyre, NS;
PUBLISHED: 2003, SOURCE: IISC-14 in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 203
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL; Karpuzov, DS; McIntyre, NS;
PUBLISHED: 2003, SOURCE: IISC-14 in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 203
107
TITLE: Dependence of scattered ion yield on the incident energy:: Ne<SUP>+</SUP> on pure gallium and indium
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL;
PUBLISHED: 2003, SOURCE: SURFACE SCIENCE, VOLUME: 531, ISSUE: 2
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL;
PUBLISHED: 2003, SOURCE: SURFACE SCIENCE, VOLUME: 531, ISSUE: 2
108
TITLE: Energy distributions of Ga<SUP>+</SUP> and In<SUP>+</SUP> secondary ions sputtered from A<SUP>III</SUP>B<SUP>V</SUP> compound semiconductors by noble gas ions:: Mass-dependence of the high-energy yield on the second component (P, As, Sb) of the compounds
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL; Karpuzov, DS; McIntyre, NS;
PUBLISHED: 2003, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 203
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL; Karpuzov, DS; McIntyre, NS;
PUBLISHED: 2003, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 203
INDEXED IN: 
WOS
WOS IN MY: ORCID
ORCID109
TITLE: Simultaneous layer-by-layer analysis of thin-film samples using mass-separated ion scattering, mass-spectrometry of secondary ions techniques and measuring the sample's full current obraztsa
AUTHORS: Tolstoguzov, AB; Grinvud, KL;
PUBLISHED: 2002, SOURCE: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, ISSUE: 12
AUTHORS: Tolstoguzov, AB; Grinvud, KL;
PUBLISHED: 2002, SOURCE: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, ISSUE: 12
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID110
TITLE: Energy distributions of secondary ions sputtered from aluminium and magnesium by Ne<SUP>+</SUP>, Ar<SUP>+</SUP> and O<sub>2</sub><SUP>+</SUP>:: a comprehensive study
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL;
PUBLISHED: 2002, SOURCE: INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, VOLUME: 214, ISSUE: 3
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C; Greenwood, CL;
PUBLISHED: 2002, SOURCE: INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, VOLUME: 214, ISSUE: 3
