71
TITLE: Nonuniversality due to inhomogeneous stress in semiconductor surface nanopatterning by low-energy ion-beam irradiation
AUTHORS: Moreno-Barrado A.; Castro M.; Gago R.; Vázquez L.; Muñoz-García J.; Redondo-Cubero A.; Galiana B.; Ballesteros C.; Cuerno R.;
PUBLISHED: 2015, SOURCE: Physical Review B - Condensed Matter and Materials Physics, VOLUME: 91, ISSUE: 15
INDEXED IN: Scopus
IN MY: ORCID
72
TITLE: Influence of lateral and in- depth metal segregation on the patterning of ohmic contacts for GaN-based devices  Full Text
AUTHORS: Redondo Cubero, A; Vazquez, L; Alves, LC; Corregidor, V; Romero, MF; Pantellini, A; Lanzieri, C; Munoz, E;
PUBLISHED: 2014, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 47, ISSUE: 18
INDEXED IN: Scopus WOS
73
TITLE: Comparative analysis of anodized, implanted and sputtered tantalum oxide targets for the study of O-16+O-16 fusion reaction  Full Text
AUTHORS: Silva, H; Cruz, J ; Redondo Cubero, A; Santos, C; Fonseca, M. ; Luis, H; Jesus, AP ;
PUBLISHED: 2014, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 331
INDEXED IN: Scopus WOS CrossRef: 2
74
TITLE: Ion beam analysis: New trends and challenges  Full Text
AUTHORS: Alessandro Zucchiatti; Andres Redondo Cubero;
PUBLISHED: 2014, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 331
INDEXED IN: Scopus WOS CrossRef
75
TITLE: Influence of metal co-deposition on silicon nanodot patterning dynamics during ion-beam sputtering
AUTHORS: Gago, R; Redondo Cubero, A; Palomares, FJ; Vazquez, L;
PUBLISHED: 2014, SOURCE: NANOTECHNOLOGY, VOLUME: 25, ISSUE: 41
INDEXED IN: Scopus WOS CrossRef
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76
TITLE: Self-organized nanopattrening of silicon surfaces by ion beam sputtering  Full Text
AUTHORS: Javier Munoz Garcia; Luis Vazquez; Mario Castro; Raul Gago; Andres Redondo Cubero; Ana Moreno Barrado; Rodolfo Cuerno;
PUBLISHED: 2014, SOURCE: MATERIALS SCIENCE & ENGINEERING R-REPORTS, VOLUME: 86
INDEXED IN: WOS
77
TITLE: Influence of lateral and in-depth metal segregation on the patterning of ohmic contacts for GaN-based devices  Full Text
AUTHORS: Redondo-Cubero, A; Vázquez, L; Alves, LC; Corregidor, V; Romero, MF; Pantellini, A; Lanzieri, C; Muñoz, E;
PUBLISHED: 2014, SOURCE: Journal of Physics D: Applied Physics - J. Phys. D: Appl. Phys., VOLUME: 47, ISSUE: 18
INDEXED IN: CrossRef
IN MY: ORCID
78
TITLE: Self-organized nanopatterning of silicon surfaces by ion beam sputtering  Full Text
AUTHORS: Javier Muñoz-García; Luis Vázquez; Mario Castro; Raúl Gago; Andrés Redondo-Cubero; Ana Moreno-Barrado; Rodolfo Cuerno;
PUBLISHED: 2014, SOURCE: Materials Science and Engineering: R: Reports, VOLUME: 86
INDEXED IN: CrossRef
IN MY: ORCID
79
TITLE: Self-organized nanopatterning of silicon surfaces by ion beam sputtering
AUTHORS: Javier Muñoz García; Luis Vázquez; Mario Castro; Raúl Gago; Andrés Redondo Cubero; Ana Moreno Barrado; Rodolfo Cuerno;
PUBLISHED: 2014, SOURCE: Materials Science and Engineering R: Reports, VOLUME: 86
INDEXED IN: Scopus
IN MY: ORCID
80
TITLE: X-ray absorption near-edge structure of hexagonal ternary phases in sputter-deposited TiAlN films  Full Text
AUTHORS: Gago, R; Soldera, F; Huebner, R; Lehmann, J; Munnik, F; Vazquez, L; Redondo Cubero, A; Endrino, JL;
PUBLISHED: 2013, SOURCE: JOURNAL OF ALLOYS AND COMPOUNDS, VOLUME: 561
INDEXED IN: Scopus WOS CrossRef
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