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TITLE: Low power BIST by filtering non-detecting vectors  Full Text
AUTHORS: Manich, S; Gabarro, A; Lopez, M; Figueras, J; Girard, P; Guiller, L; Landrault, C; Pravossoudovitch, S; Teixeira, P ; Santos, M ;
PUBLISHED: 2000, SOURCE: 6th IEEE International O-Line Testing Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 16, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 19