João Paulo Cacho Teixeira
AuthID: R-000-7A4
131
TITLE: Programmable Aging Sensor for Automotive Safety-Critical Applications
AUTHORS: Vazquez, JC; Champac, V; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2010, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE) in 2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010)
AUTHORS: Vazquez, JC; Champac, V; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2010, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE) in 2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010)
INDEXED IN: WOS
132
TITLE: Built-In Clock Domain Crossing (CDC) Test and Diagnosis in GALS Systems
AUTHORS: Leong, C; Machado, P; Bexiga, V; Teixeira, JP; Teixeira, IC; Silva, JC; Lousa, P; Varela, J;
PUBLISHED: 2010, SOURCE: 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems in PROCEEDINGS OF THE 13TH IEEE SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS
AUTHORS: Leong, C; Machado, P; Bexiga, V; Teixeira, JP; Teixeira, IC; Silva, JC; Lousa, P; Varela, J;
PUBLISHED: 2010, SOURCE: 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems in PROCEEDINGS OF THE 13TH IEEE SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS
INDEXED IN: WOS
133
TITLE: Genetic effects and biotoxicity monitoring of occupational styrene exposure Full Text
AUTHORS: Jose Rueff ; Joao P Teixeira; Luis Silva Santos; Jorge Francisco Gaspar ;
PUBLISHED: 2009, SOURCE: CLINICA CHIMICA ACTA, VOLUME: 399, ISSUE: 1-2
AUTHORS: Jose Rueff ; Joao P Teixeira; Luis Silva Santos; Jorge Francisco Gaspar ;
PUBLISHED: 2009, SOURCE: CLINICA CHIMICA ACTA, VOLUME: 399, ISSUE: 1-2
134
TITLE: Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies Full Text
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
135
TITLE: Parameterization of convective boundary layer turbulence and clouds in atmospheric models
AUTHORS: Soares, PMM; Teixeira, J; Miranda, PMA;
PUBLISHED: 2009, SOURCE: Air Pollution and Turbulence: Modeling and Applications
AUTHORS: Soares, PMM; Teixeira, J; Miranda, PMA;
PUBLISHED: 2009, SOURCE: Air Pollution and Turbulence: Modeling and Applications
INDEXED IN: Scopus
136
TITLE: Genotoxic damage in pathology anatomy laboratory workers exposed to formaldehyde Full Text
AUTHORS: Solange Costa; Patricia Coelho; Carla Costa ; Susana Silva; Olga Mayan; Luis Silva Santos; Jorge Gaspar ; Joao Paulo Teixeira;
PUBLISHED: 2008, SOURCE: TOXICOLOGY, VOLUME: 252, ISSUE: 1-3
AUTHORS: Solange Costa; Patricia Coelho; Carla Costa ; Susana Silva; Olga Mayan; Luis Silva Santos; Jorge Gaspar ; Joao Paulo Teixeira;
PUBLISHED: 2008, SOURCE: TOXICOLOGY, VOLUME: 252, ISSUE: 1-3
137
TITLE: Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
AUTHORS: Jorge Semião ; Freijedo, J; Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 14th IEEE International On-Line Testing Symposium in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
AUTHORS: Jorge Semião ; Freijedo, J; Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 14th IEEE International On-Line Testing Symposium in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
138
TITLE: Process tolerant design using thermal and power-supply tolerance in pipeline based circuits
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 11th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 11th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
139
TITLE: Power-Supply Instability Aware Clock Signal Modulation for Digital Integrated Circuits
AUTHORS: Jorge Semião ; Freijedo, J; Moraes, M; Mallmann, M; Antunes, C ; Rocha, L; Benfica, J; Vargas, F; Santos, M ; Teixeira, IC ; Rodriguez Andina, JJR; Teixeira, JP; Lupi, D; Gatti, E; Garcia, L; Hernandez, F;
PUBLISHED: 2008, SOURCE: International Symposium on Electromagnetic Compatibility in 2008 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE)
AUTHORS: Jorge Semião ; Freijedo, J; Moraes, M; Mallmann, M; Antunes, C ; Rocha, L; Benfica, J; Vargas, F; Santos, M ; Teixeira, IC ; Rodriguez Andina, JJR; Teixeira, JP; Lupi, D; Gatti, E; Garcia, L; Hernandez, F;
PUBLISHED: 2008, SOURCE: International Symposium on Electromagnetic Compatibility in 2008 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE)
140
TITLE: The CMS experiment at the CERN LHC
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS