João Paulo Cacho Teixeira
AuthID: R-000-7A4
201
TITLE: DFT and probabilistic testability analysis at RTL Full Text
AUTHORS: Jose M Fernandes; Marcelino B Santos ; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 11th Annual IEEE International Workshop on High Level Design Validation and Test in HLDVT'06: ELEVENTH ANNUAL IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS
AUTHORS: Jose M Fernandes; Marcelino B Santos ; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 11th Annual IEEE International Workshop on High Level Design Validation and Test in HLDVT'06: ELEVENTH ANNUAL IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS
202
TITLE: Probabilistic testability analysis and DFT methods at RTL
AUTHORS: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
AUTHORS: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
203
TITLE: Genotoxic effects in a population of nurses handling antineoplastic drugs, and relationship with genetic polymorphisms in DNA repair enzymes Full Text
AUTHORS: Laffon, B; Teixeira, JP; Silva, S; Loureiro, J; Torres, J; Pasaro, E; Mendez, J; Mayan, O;
PUBLISHED: 2005, SOURCE: AMERICAN JOURNAL OF INDUSTRIAL MEDICINE, VOLUME: 48, ISSUE: 2
AUTHORS: Laffon, B; Teixeira, JP; Silva, S; Loureiro, J; Torres, J; Pasaro, E; Mendez, J; Mayan, O;
PUBLISHED: 2005, SOURCE: AMERICAN JOURNAL OF INDUSTRIAL MEDICINE, VOLUME: 48, ISSUE: 2
204
TITLE: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip Full Text
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
205
TITLE: Occupational exposure to styrene: modulation of cytogenetic damage and levels of urinary metabolites of styrene by polymorphisms in genes CYP2E1, EPHX1, GSTM1, GSTT1 and GSTP1 Full Text
AUTHORS: Teixeira, JP; Gaspar, J ; Silva, S; Torres, J; Silva, SN ; Azevedo, MC; Neves, P; Laffon, B; Mendez, J; Goncalves, C; Mayan, O; Farmer, PB; Rueff, J ;
PUBLISHED: 2004, SOURCE: TOXICOLOGY, VOLUME: 195, ISSUE: 2-3
AUTHORS: Teixeira, JP; Gaspar, J ; Silva, S; Torres, J; Silva, SN ; Azevedo, MC; Neves, P; Laffon, B; Mendez, J; Goncalves, C; Mayan, O; Farmer, PB; Rueff, J ;
PUBLISHED: 2004, SOURCE: TOXICOLOGY, VOLUME: 195, ISSUE: 2-3
206
TITLE: A probabilistic method for the computation of testability of RTL constructs
AUTHORS: Fernandes, JM; Santos, MB ; Oliveira, AL ; Teixeira, JC;
PUBLISHED: 2004, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 04) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, VOLUME: 1
AUTHORS: Fernandes, JM; Santos, MB ; Oliveira, AL ; Teixeira, JC;
PUBLISHED: 2004, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 04) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, VOLUME: 1
207
TITLE: Technical feasibility assessment of oleic sunflower methyl ester utilisation in Diesel bus engines Full Text
AUTHORS: da Silva, FN ; Prata, AS; Teixeira, JR;
PUBLISHED: 2003, SOURCE: ENERGY CONVERSION AND MANAGEMENT, VOLUME: 44, ISSUE: 18
AUTHORS: da Silva, FN ; Prata, AS; Teixeira, JR;
PUBLISHED: 2003, SOURCE: ENERGY CONVERSION AND MANAGEMENT, VOLUME: 44, ISSUE: 18
208
TITLE: Aromatic DNA adduct levels in coke oven workers: correlation with polymorphisms in genes GSTP1, GSTM1, GSTT1 and CYP1A1 Full Text
AUTHORS: Teixeira, JP; Gaspar, J ; Martinho, G; Silva, S; Rodrigues, S; Mayan, O; Martin, E; Farmer, PB; Rueff, J ;
PUBLISHED: 2002, SOURCE: MUTATION RESEARCH-GENETIC TOXICOLOGY AND ENVIRONMENTAL MUTAGENESIS, VOLUME: 517, ISSUE: 1-2
AUTHORS: Teixeira, JP; Gaspar, J ; Martinho, G; Silva, S; Rodrigues, S; Mayan, O; Martin, E; Farmer, PB; Rueff, J ;
PUBLISHED: 2002, SOURCE: MUTATION RESEARCH-GENETIC TOXICOLOGY AND ENVIRONMENTAL MUTAGENESIS, VOLUME: 517, ISSUE: 1-2
209
TITLE: Optimizing functional distribution in complex system design
AUTHORS: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLISHED: 2001, SOURCE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
AUTHORS: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLISHED: 2001, SOURCE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
INDEXED IN: 
Scopus 
WOS
Scopus WOS210
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS