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Probabilistic Testability Analysis and Dft Methods at Rtl

AuthID
P-004-QJK

Author(s)

Fernandes, JM

Editor(s)

Matteo Sonza Reorda; Ondrej Novák; Bernd Straube; Hana Kubatova; Zdenek Kotásek; Pavel Kubalík; Raimund Ubar; Jiri Bucek

Document Type

Proceedings Paper

Year published

2006

Published

in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in DDECS

Pages: 216-217 (2)

Conference

9Th Ieee Workshop on Design and Diagnostics of Electronic Circuits and Systems, Date: APR 18-21, 2006, Location: Prague, CZECH REPUBLIC, Sponsors: IEEE Comp Soc, TTTC, Czech Tech Univ

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Dblp^®/en/publications/view/155219

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Metadata
Sources

Publication Identifiers

DOI: 10.1109/ddecs.2006.1649614

DBLP: conf/ddecs/FernandesSOT06

Wos: WOS:000238973400056

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