Performance Sensor for Tolerance and Predictive Detection of Delay-Faults

AuthID
P-00A-0PC
7
Author(s)
Saraiva, D
·
Leong, C
·
Romao, A
·
Document Type
Proceedings Paper
Year published
2014
Published
in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, ISSN: 1550-5774
Pages: 110-115
Conference
27Th Ieee International Symposium on Defect and Fault Tolerance in Vlsi and Nanotechnology Systems, Dft 2014, Date: 1 October 2014 through 3 October 2014, Sponsors: IEEE Computer Society;IEEE Fault-Tolerant Computing Technical Committee;IEEE Test Technology Technical Council (TTTC)
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Publication Identifiers
SCOPUS: 2-s2.0-84914674755
Source Identifiers
ISSN: 1550-5774
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