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201

TÃTULO: Ion nitriding of Al: growth kinetics and characterisation of the nitride layer Full Text
AUTORES: Telbizova, T; Parascandola, S; Prokert, F; Barradas, NP ; Richter, E; Moller, W;
PUBLICAÇÃO: 2001, FONTE: 7th International Conference on Plasma Surface Engineering (PSE 2000) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 142

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202

TÃTULO: Monte Carlo calculations for neutron and gamma radiation fields on a fast neutron irradiation device
AUTORES: Vieira, A; Ramalho, A; Goncalves, IC; Fernandes, A; Barradas, N ; Marques, JG; Prata, J; Chaussy, C;
PUBLICAÇÃO: 2001, FONTE: International Conference on Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications in ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS

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203

TÃTULO: Radiation tests on commercial instrumentation amplifiers, analog switches & DAC's
AUTORES: Agapito, JA; Barradas, NP ; Cardeira, FM; Casas, J; Fernandes, AP; Franco, FJ; Gomes, P; Goncalves, IC; Cachero, AH; Lozano, J; Marques, JG; Paz, A; Prata, MJ; Ramalho, AJG; Ruiz, MAR; Santos, JP; Vieira, A;
PUBLICAÇÃO: 2001, FONTE: 7th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE SEVENTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS, VOLUME: 2001, NÚMERO: 5

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204

TÃTULO: RBS analysis of MBE grown SiGe/(001)Si heterostructures with thin high Ge content SiGe channels for HMOS transistors Full Text
AUTORES: Barradas, NP ; Sequeira, AD; Franco, N; Myronov, M; Mironov, OA; Phillips, PJ; Parker, EHC;
PUBLICAÇÃO: 2001, FONTE: Workshop on Advanced Materials Produced and Analyzed with Ion Beams in MODERN PHYSICS LETTERS B, VOLUME: 15, NÚMERO: 28-29

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205

TÃTULO: Resistance decrease in spin tunnel junctions by control of natural oxidation conditions Full Text
AUTORES: Zhang, ZG; Freitas, PP ; Ramos, AR ; Barradas, NP ; Soares, JC ;
PUBLICAÇÃO: 2001, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 79, NÚMERO: 14

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206

TÃTULO: Rutherford backscattering analysis of thin films and superlattices with roughness
AUTORES: Barradas, NP ;
PUBLICAÇÃO: 2001, FONTE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 34, NÚMERO: 14

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207

TÃTULO: Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride) Full Text
AUTORES: Ross, GJ; Barradas, NP ; Hill, MP; Jeynes, C; Morrissey, P; Watts, JF;
PUBLICAÇÃO: 2001, FONTE: JOURNAL OF MATERIALS SCIENCE, VOLUME: 36, NÚMERO: 19

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208

TÃTULO: Tunnel junctions with AlN barriers and FeTaN electrodes Full Text
AUTORES: Wang, JG; Cardoso, S ; Freitas, PP ; Wei, P; Barradas, NP ; Soares, JC ;
PUBLICAÇÃO: 2001, FONTE: 8th Joint MMM/Intermag Conference in JOURNAL OF APPLIED PHYSICS, VOLUME: 89, NÚMERO: 11

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209

TÃTULO: Accurate depth profiling of complex optical coatings Full Text
AUTORES: Jeynes, C; Barradas, NP ; Rafla Yuan, H; Hichwa, BP; Close, R;
PUBLICAÇÃO: 2000, FONTE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, NÚMERO: 1

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210