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TÃTULO: Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrix
AUTORES: Vieira, EMF; Pinto, SRC; Levichev, S ; Rolo, AG ; Chahboun, A ; Buljan, M; Barradas, NP ; Alves, E ; Bernstorff, S; Conde, O ; Gomes, MJM ;
PUBLICAÇÃO: 2011, FONTE: EMRS 2010 Spring Meeting on Post-Si-CMOS Electronic Devices - The Role of Ge and III-V Materials in MICROELECTRONIC ENGINEERING, VOLUME: 88, NÚMERO: 4

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TÃTULO: Integration Of SIMS Into A General Purpose IBA Data Analysis Code Full Text
AUTORES: Barradas, NP ; Likonen, J; Alves, E ; Alves, LC ; Coad, P; Hakola, A; Widdowson, A; Floyd D McDaniel; Barney L Doyle;
PUBLICAÇÃO: 2011, FONTE: 21st International Conference on Application of Accelerators in Research and Industry (CAARI) in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: TWENTY-FIRST INTERNATIONAL CONFERENCE, VOLUME: 1336

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TÃTULO: Low-temperature fabrication of layered self-organized Ge clusters by RF-sputtering
AUTORES: Pinto, SRC; Rolo, AG ; Buljan, M; Chahboun, A ; Bernstorff, S; Barradas, NP ; Alves, E ; Kashtiban, RJ; Bangert, U; Gomes, MJM ;
PUBLICAÇÃO: 2011, FONTE: NANOSCALE RESEARCH LETTERS, VOLUME: 6, NÚMERO: 1

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TÃTULO: Materials research under ITER-like divertor conditions at FOM Rijnhuizen Full Text
AUTORES: Wright, GM; Westerhout, J; Al, RS; Alves, E ; Alves, LC ; Barradas, NP ; van den Berg, MA; Borodin, D; Brezinsek, S; Brons, S; van Eck, HJN; de Groot, B; Kleyn, AW; Koppers, WR; Kruijt, OG; Linke, J; Lopes J L Cardozo; Mayer, M; van der Meiden, HJ; Prins, PR; van Rooij, GJ; Scholten, J; Shumack, AE; Smeets, PHM; De Temmerman, G; Vijvers, WAJ; Rapp, J; ...Mais
PUBLICAÇÃO: 2011, FONTE: 14th International Conference on Fusion Reactor Materials (ICFRM) in JOURNAL OF NUCLEAR MATERIALS, VOLUME: 417, NÚMERO: 1-3

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TÃTULO: Measurements and Evaluation of Differential Cross-sections for Ion Beam Analysis
AUTORES: Gurbich, AF; Abriola, D; Barradas, NP ; Ramos, AR ; Bogdanovic Radovic, I; Chiari, M; Jeynes, C; Kokkoris, M; Mayer, M; Shi, L; Vickridge, I;
PUBLICAÇÃO: 2011, FONTE: JOURNAL OF THE KOREAN PHYSICAL SOCIETY, VOLUME: 59, NÚMERO: 2

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TÃTULO: Optimization Of A Mass Spectrometry Process
AUTORES: Jose Lopes ; Correa Alegria, FC ; Luis Redondo ; Barradas, NP ; Alves, E ; Jorge Rocha;
PUBLICAÇÃO: 2011, FONTE: 21st International Conference on Application of Accelerators in Research and Industry (CAARI) in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: TWENTY-FIRST INTERNATIONAL CONFERENCE, VOLUME: 1336

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TÃTULO: PIXE analysis of multilayer targets Full Text
AUTORES: Miguel A. Reis ; Barradas, NP ; Chaves, PC ; Taborda, A ;
PUBLICAÇÃO: 2011, FONTE: X-RAY SPECTROMETRY, VOLUME: 40, NÚMERO: 3

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TÃTULO: Preparation and characterization of CrNxOy thin films: The effect of composition and structural features on the electrical behavior Full Text
AUTORES: Arvinte, R; Borges, J; Sousa, RE; Munteanu, D; Barradas, NP ; Alves, E ; Vaz, F ; Marques, L ;
PUBLICAÇÃO: 2011, FONTE: APPLIED SURFACE SCIENCE, VOLUME: 257, NÚMERO: 21

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TÃTULO: Stopping Power Of He, C And O In InN Full Text
AUTORES: Barradas, NP ; Alves, E ; Siketic, Z; Radovic, IB;
PUBLICAÇÃO: 2011, FONTE: 21st International Conference on Application of Accelerators in Research and Industry (CAARI) in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: TWENTY-FIRST INTERNATIONAL CONFERENCE, VOLUME: 1336

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