61
TÍTULO: Pull-in dynamics: Analysis and modeling of the transitional regime
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th IEEE International Conference on Micro Electro Mechanical Systems (MEMS): Maastricht MEMS 2004 Technical Digest in Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
INDEXADO EM: Scopus
NO MEU: ORCID
62
TÍTULO: Quadrature oscillator with pre-distorted waveforms for application in MEMS-based mechanical spectrum analyser
AUTORES: de Graaf, G; Mol, L; Rocha, L ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 30th European Solid-State Circuits Conference (ESSCIRC 2004) in ESSCIRC 2004: PROCEEDINGS OF THE 30TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE
INDEXADO EM: Scopus WOS
63
TÍTULO: Electro-mechanical feedback for realization of a mechanical spectrum analyzer
AUTORES: Cretu, E; Rocha, LA ; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 12th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 03) in BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, VOLUME: 2
INDEXADO EM: Scopus WOS CrossRef: 1
NO MEU: ORCID
64
TÍTULO: Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTORES: Rocha, LA ; Cretu, E; De Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXADO EM: Scopus
NO MEU: ORCID
65
TÍTULO: Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTORES: Rocha, LA ; Cretu, E; de Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
INDEXADO EM: WOS
66
TÍTULO: Performance of integrated silicon infrared microspectrometers
AUTORES: Kong, SH; De Graaf, G; Rocha, LA ; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
NO MEU: ORCID
67
TÍTULO: Stability of silicon microfabricated pull-in voltage references
AUTORES: Rocha, LA ; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: Conference on Precision Electromagnetic Measurements (CPEM 2002) in 2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST
INDEXADO EM: Scopus WOS
68
TÍTULO: The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: 19th IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
NO MEU: ORCID
69
TÍTULO: The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2
INDEXADO EM: WOS
70
TÍTULO: Using the pull-in voltage as voltage reference
AUTORES: Cretu, E; Rocha, LA ; Wolffenbuttel, RF;
PUBLICAÇÃO: 2001, FONTE: 11th International Conference on Solid-State Sensors and Actuators in TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
INDEXADO EM: WOS
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