ProfileOfResearchers

291

TITLE: Beam analysis of Ge/Si dots grown on ultrathin SiO2 interlayers
AUTHORS: Fonseca, A; Alves, E ; Leitao, JP ; Sobolev, NA; Carmo, MC; Nikiforov, AI;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 2

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292

TITLE: Behaviour of the AlN cap during GaN implantation of rare earths and annealing Full Text
AUTHORS: Florence Gloux; Tomasz Wojtowicz; Pierre Ruterana; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: Symposium on Interfacial Processes and Properties of Advanced Materials held at the 2005 E-MRS Fall Meeting in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 203, ISSUE: 9

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293

TITLE: Blue cathodoluminescence from thulium implanted AlxGa1-xN and InxAl1-xN Full Text
AUTHORS: Roqan, IS; Lorenz, K ; O'Donnell, KP; Trager Cowan, C; Martin, RW; Watson, IM; Alves, E ;
PUBLISHED: 2006, SOURCE: Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 40, ISSUE: 4-6

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294

TITLE: Cathodoluminescence of rare earth implanted AlInN Full Text
AUTHORS: Wang, K; Martin, RW; Nogales, E; Edwards, PR; O'Donnell, KP; Lorenz, K ; Alves, E ; Watson, IM;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 89, ISSUE: 13

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295

TITLE: Characterization of nickel implanted alpha-Al(2)O(3)
AUTHORS: Marques, C; Franco, N; da Silva, RC; Wemans, A; Maneira, MJP; Alves, E ;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1

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296

TITLE: Characterization of the blue emission of Tm/Er co-implanted GaN
AUTHORS: Roqan, IS; Trager Cowan, C; Hourahine, B; Lorenz, K ; Nogales, E; O'Donnell, KP; Martin, RW; Alves, E ; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: 2005 Materials Research Society Fall Meeting in Materials Research Society Symposium Proceedings, VOLUME: 892

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297

TITLE: Combination of IBA techniques for composition analysis of GaInAsSb films
AUTHORS: Corregidor, V; Chaves, PC ; Miguel A. Reis ; Pascual Izarra, C; Alves, E ; Barradas, NP ;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 2

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298

TITLE: Compositional and structural changes in ZrOxNy films depending on growth condition Full Text
AUTHORS: Carvalho, P; Fernandes, AC; Rebouta, L ; Vaz, F ; Cunha, L ; Kreissig, U; Barradas, NP ; Ramos, AR ; Alves, E ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.

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299

TITLE: Damage behaviour of GaAs/AlAs multilayer structures Full Text
AUTHORS: Magalhaes, S; Fonseca, A; Franco, N; Barradas, NP ; Sobolev, N; Hey, R; Grahn, H; Alves, E ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.

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300

TITLE: Defect production in neutron irradiated GaN Full Text
AUTHORS: Marques, JG ; Lorenz, K ; Franco, N; Alves, E ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.

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