331
TITLE: Optical properties tailoring by high fluence implantation of Ag ions on sapphire  Full Text
AUTHORS: Marques, C; da Silva, RC; Wemans, A; Maneira, MJP; Kozanecki, A; Alves, E ;
PUBLISHED: 2006, SOURCE: 14th International Conference on Ion Beam Modification of Materials (IBMM 2004) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 242, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 8
332
TITLE: Optical studies on a coherent InGaN/GaN layer  Full Text
AUTHORS: Correia, MR ; Pereira, S ; Alves, E ; Arnaudov, B;
PUBLISHED: 2006, SOURCE: Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 40, ISSUE: 4-6
INDEXED IN: Scopus WOS CrossRef: 2
333
TITLE: Phase separation on GaInAsSb films for thermophotovoltaic devices
AUTHORS: Corregidor, V; Franco, N; Alves, E ; Barradas, NP ;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1
INDEXED IN: Scopus WOS
334
TITLE: Phase transformation and structural studies of EUROFER RAFM alloy
AUTHORS: Paul, A; Beirante, A; Franco, N; Alves, E ; Odriozola, JA;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1
INDEXED IN: Scopus WOS
335
TITLE: Properties of MoNxOy thin films as a function of the N/O ratio  Full Text
AUTHORS: Barbosa, J; Cunha, L ; Rebouta, L ; Moura, C ; Vaz, F ; Carvalho, S ; Alves, E ; Le Bourhis, E; Goudeau, P; Riviere, JP;
PUBLISHED: 2006, SOURCE: 32nd International Conference on Metallurgical Coatings and Thin Film in THIN SOLID FILMS, VOLUME: 494, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
336
TITLE: Radiation-induced defects in a-Si : H by 1.5 MeV He-4 particles studied by photoconductivity and photothermal deflection spectroscopy  Full Text
AUTHORS: Morgado, E; Schwarz, R ; Braz, T; Casteleiro, C; Macarico, A; Vieira, M ; Alves, E ;
PUBLISHED: 2006, SOURCE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, ISSUE: 9-20
INDEXED IN: Scopus WOS CrossRef
337
TITLE: Raman spectra and structural analysis in ZrOxNy thin films  Full Text
AUTHORS: Moura, C ; Carvalho, P; Vaz, F ; Cunha, L ; Alves, E ;
PUBLISHED: 2006, SOURCE: 33rd International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 515, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
338
TITLE: Rare earth ion implantation in GaN: Damage formation and recovery
AUTHORS: Gloux, F; Ruterana, P; Wojtowicz, T; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: 35th International School on the Physics of Semiconducting Compounds in ACTA PHYSICA POLONICA A, VOLUME: 110, ISSUE: 2
INDEXED IN: Scopus WOS
339
TITLE: RBS and XRD analysis of SiGe/Ge heterostructures for p-HMOS applications  Full Text
AUTHORS: Franco, N; Alves, E ; Vallera, A; Morris, RJH; Mironov, OA; Parker, EHC; Barradas, NP ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
340
TITLE: RBS/channeling study of buried Ge quantum dots grown in a Si layer  Full Text
AUTHORS: Fonseca, A; Alves, E ; Barradas, NP ; P. Leitao ; Sobolev, NA; Carmo, MC; Nikiforov, AI; Presting, H;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef: 4
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