Jakub Kral
AuthID: R-003-7C3
1
TÃTULO: An SVM approach with electromagnetic methods to assess metal plate thickness Full Text
AUTORES: Helena G Ramos ; Tiago Rocha; Jakub Kral; Dario Pasadas; Artur L Ribeiro;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 54
AUTORES: Helena G Ramos ; Tiago Rocha; Jakub Kral; Dario Pasadas; Artur L Ribeiro;
PUBLICAÇÃO: 2014, FONTE: MEASUREMENT, VOLUME: 54
2
TÃTULO: The Lift-Off Effect in Eddy Currents on Thickness Modeling and Measurement
AUTORES: Jakub Kral; Radislav Smid; Helena Maria G Geirinhas Ramos ; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, NÚMERO: 7
AUTORES: Jakub Kral; Radislav Smid; Helena Maria G Geirinhas Ramos ; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, NÚMERO: 7
3
TÃTULO: Assessing metal plate thickness: An SVM approach with electromagnetic methods
AUTORES: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
AUTORES: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLICAÇÃO: 2013, FONTE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
INDEXADO EM: 
Scopus
Scopus4
TÃTULO: Thickness Measurement Using Transient Eddy Current Techniques Full Text
AUTORES: Kral, J; Smid, R; Geirnhas Ramos, HMG ; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2011, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTORES: Kral, J; Smid, R; Geirnhas Ramos, HMG ; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2011, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
