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TÍTULO: High quality ion-induced secondary electron imaging for MeV nuclear microprobe applications
AUTORES: Teo, EJ; Breese, MBH; Bettiol, AA; Watt, F; Alves, LC ;
PUBLICAÇÃO: 2004, FONTE: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, VOLUME: 22, NÚMERO: 2
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TÍTULO: Microscopic evaluation of spatial variations in material and charge transport properties of CdZnTe radiation detectors  Full Text
AUTORES: Rath, S; Sellin, PJ; Breese, MBH; Herman, H; Alves, LC ; Holland, AH;
PUBLICAÇÃO: 2003, FONTE: 9th European Symposium on Semiconductor Detectors in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, VOLUME: 512, NÚMERO: 1-2
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TÍTULO: A photomultiplier-based secondary electron imaging system for a nuclear microprobe  Full Text
AUTORES: Alves, LC ; Breese, MBH; da Silva, MF; Soares, JC;
PUBLICAÇÃO: 2002, FONTE: 7th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 188, NÚMERO: 1-4
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TÍTULO: Imaging of charge transport properties in polycrystalline CVD diamond using IBIC and IBIL microscopy  Full Text
AUTORES: Breese, MBH; Sellin, PJ; Alves, LC ; Knights, AP; Sussmann, RS; Whitehead, AJ;
PUBLICAÇÃO: 2001, FONTE: 7th International Conference on Nuclear Microprobe Technology and Applications in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 181, NÚMERO: 1-4
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TÍTULO: Imaging of charge transport in polycrystalline diamond using ion-beam-induced charge microscopy  Full Text
AUTORES: Sellin, PJ; Breese, MBH; Knights, AP; Alves, LC ; Sussmann, RS; Whitehead, AJ;
PUBLICAÇÃO: 2000, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 77, NÚMERO: 6
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TÍTULO: Study of the crystalline quality of exfoliated surfaces in hydrogen-implanted silicon  Full Text
AUTORES: Breese, MBH; Alves, LC ; Hoechbauer, T; Nastasi, M;
PUBLICAÇÃO: 2000, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 77, NÚMERO: 2
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Micron-scale analysis of SiC/SiCf composites using the new Lisbon nuclear microprobe  Full Text
AUTORES: Alves, LC ; Breese, MBH; Alves, E ; Paul, A; da Silva, MR ; da Silva, MF; Soares, JC;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Defect imaging using convergent beam ion channeling patterns  Full Text
AUTORES: Breese, MBH; Bailes, AA;
PUBLICAÇÃO: 1998, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 140, NÚMERO: 1-2
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: An optimised beam rocking system to produce angle-resolved information from small areas  Full Text
AUTORES: de Kerckhove, DG; Breese, MBH; Grime, GW;
PUBLICAÇÃO: 1998, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 140, NÚMERO: 1-2
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TÍTULO: Strain and defect imaging in thin crystals using a nuclear microprobe  Full Text
AUTORES: Breese, MBH; King, PJC; de Kerckhove, DG;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
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