C. Jeynes
AuthID: R-006-GF6
21
TÃTULO: Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing Full Text
AUTORES: Barradas, NP ; Jeynes, C; Webb, RP; Kreissig, U; Grotzschel, R;
PUBLICAÇÃO: 1999, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 149, NÚMERO: 1-2
AUTORES: Barradas, NP ; Jeynes, C; Webb, RP; Kreissig, U; Grotzschel, R;
PUBLICAÇÃO: 1999, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 149, NÚMERO: 1-2
22
TÃTULO: Bayesian error analysis of Rutherford backscattering spectra Full Text
AUTORES: Barradas, NP ; Jeynes, C; Jenkin, M; Marriott, PK;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2
AUTORES: Barradas, NP ; Jeynes, C; Jenkin, M; Marriott, PK;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2
23
TÃTULO: Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD Full Text
AUTORES: Toal, SJ; Reehal, HS; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96) in APPLIED SURFACE SCIENCE, VOLUME: 138, NÚMERO: 1-4
AUTORES: Toal, SJ; Reehal, HS; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96) in APPLIED SURFACE SCIENCE, VOLUME: 138, NÚMERO: 1-4
24
TÃTULO: High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms
AUTORES: Barradas, NP ; Knights, AP; Jeynes, C; Mironov, OA; Grasby, TJ; Parker, EHC;
PUBLICAÇÃO: 1999, FONTE: PHYSICAL REVIEW B, VOLUME: 59, NÚMERO: 7
AUTORES: Barradas, NP ; Knights, AP; Jeynes, C; Mironov, OA; Grasby, TJ; Parker, EHC;
PUBLICAÇÃO: 1999, FONTE: PHYSICAL REVIEW B, VOLUME: 59, NÚMERO: 7
25
TÃTULO: Rapid accurate automated analysis of complex ion beam analysis data
AUTORES: Marriott, PK; Jenkin, M; Jeynes, C; Barradas, NP ; Webb, RP; Sealy, BJ;
PUBLICAÇÃO: 1999, FONTE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
AUTORES: Marriott, PK; Jenkin, M; Jeynes, C; Barradas, NP ; Webb, RP; Sealy, BJ;
PUBLICAÇÃO: 1999, FONTE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXADO EM: 
WOS
WOS26
TÃTULO: RES and ERDA study of ion beam synthesised amorphous gallium nitride Full Text
AUTORES: Barradas, NP ; Almeida, SA; Jeynes, C; Knights, AP; Silva, SRP; Sealy, BJ;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4
AUTORES: Barradas, NP ; Almeida, SA; Jeynes, C; Knights, AP; Silva, SRP; Sealy, BJ;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4
27
TÃTULO: RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering
AUTORES: Barradas, NP ; Jeynes, C; Kusano, Y; Evetts, JE; Hutchings, IM;
PUBLICAÇÃO: 1999, FONTE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
AUTORES: Barradas, NP ; Jeynes, C; Kusano, Y; Evetts, JE; Hutchings, IM;
PUBLICAÇÃO: 1999, FONTE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXADO EM: WOS
WOS28
TÃTULO: Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD Full Text
AUTORES: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2
AUTORES: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2
29
TÃTULO: The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC Full Text
AUTORES: Kozanecki, A; Jeynes, C; Barradas, NP ; Sealy, BJ; Jantsch, W;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4
AUTORES: Kozanecki, A; Jeynes, C; Barradas, NP ; Sealy, BJ; Jantsch, W;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4
30
TÃTULO: Improved ion beam analysis facilities at the University of Surrey Full Text
AUTORES: Jeynes, C; Barradas, NP ; Blewett, MJ; Webb, RP;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
AUTORES: Jeynes, C; Barradas, NP ; Blewett, MJ; Webb, RP;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
