E. Cretu
AuthID: R-006-GVW
21
TÃTULO: Behavioural analysis of the pull-in dynamic transition Full Text
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 14th Micromechanics Europe Workshop in JOURNAL OF MICROMECHANICS AND MICROENGINEERING, VOLUME: 14, NÚMERO: 9
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 14th Micromechanics Europe Workshop in JOURNAL OF MICROMECHANICS AND MICROENGINEERING, VOLUME: 14, NÚMERO: 9
22
TÃTULO: Compensation of temperature effects on the pull-in voltage of microstructures Full Text
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th European Conference on Solid-State Transducers (Eurosensors XVII) in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 115, NÚMERO: 2-3
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th European Conference on Solid-State Transducers (Eurosensors XVII) in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 115, NÚMERO: 2-3
23
TÃTULO: Full characterisation of pull-in in single-sided clamped beams Full Text
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: EUROSENSORS XVI Conference in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 110, NÚMERO: 1-3
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: EUROSENSORS XVI Conference in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 110, NÚMERO: 1-3
24
TÃTULO: Pull-in dynamics: Analysis and modeling of the transitional regime
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th IEEE International Conference on Micro Electro Mechanical Systems (MEMS): Maastricht MEMS 2004 Technical Digest in Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th IEEE International Conference on Micro Electro Mechanical Systems (MEMS): Maastricht MEMS 2004 Technical Digest in Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
INDEXADO EM: 
Scopus
Scopus25
TÃTULO: Analytical model for the pull-in time of low-Q MEMS devices
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
INDEXADO EM: 
WOS
WOS26
TÃTULO: Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTORES: Rocha, LA ; Cretu, E; de Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
AUTORES: Rocha, LA ; Cretu, E; de Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
INDEXADO EM: WOS
WOS27
TÃTULO: Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTORES: Rocha, LA ; Cretu, E; De Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
AUTORES: Rocha, LA ; Cretu, E; De Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXADO EM: Scopus
Scopus28
TÃTULO: The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2
INDEXADO EM: WOS
WOS29
TÃTULO: The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: 19th IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: 19th IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
Scopus30
TÃTULO: Micromechanical voltage reference using the pull-in of a beam
AUTORES: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLICAÇÃO: 2001, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, NÚMERO: 6
AUTORES: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLICAÇÃO: 2001, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, NÚMERO: 6
