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TÍTULO: Residual stress states in sputtered Ti1-xSixNy films  Full Text
AUTORES: Vaz, F ; Rebouta, L ; Goudeau, P; Riviere, JP; Schaffer, E; Kleer, G; Bodmann, M;
PUBLICAÇÃO: 2002, FONTE: THIN SOLID FILMS, VOLUME: 402, NÚMERO: 1-2
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Structural transitions in hard Si-based TiN coatings: the effect of bias voltage and temperature  Full Text
AUTORES: Vaz, F ; Rebouta, L ; Goudeau, P; Girardeau, T; Pacaud, J; Riviere, JP; Traverse, A;
PUBLICAÇÃO: 2001, FONTE: 28th International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 146
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: A structural and mechanical analysis on PVD-grown (Ti,Al)N/Mo multilayers  Full Text
AUTORES: Tavares, CJ ; Rebouta, L ; Alves, E ; Cavaleiro, A ; Goudeau, P; Reviere, JP; Declemy, A;
PUBLICAÇÃO: 2000, FONTE: 27th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 377
INDEXADO EM: Scopus WOS CrossRef: 18
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TÍTULO: Characterisation of Ti1-xSixNy nanocomposite films  Full Text
AUTORES: Vaz, F ; Rebouta, L ; Goudeau, P; Pacaud, J; Garem, H; Riviere, JP; Cavaleiro, A ; Alves, E ;
PUBLICAÇÃO: 2000, FONTE: 27th International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 133
INDEXADO EM: Scopus WOS CrossRef: 154
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TÍTULO: Structural analysis of Ti1-xSixNy nanocomposite films prepared by reactive magnetron sputtering  Full Text
AUTORES: Vaz, F ; Rebouta, L ; Almeida, B ; Goudeau, P; Pacaud, J; Riviere, JP; Sousa, JBE;
PUBLICAÇÃO: 1999, FONTE: 26th International Conference on Metallurgical Coating and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 120
INDEXADO EM: Scopus WOS CrossRef
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