Fernando Manuel Duarte Gonçalves
AuthID: R-000-51G
31
TÃTULO: RTL-based functional test generation for high defects coverage in digital SOCs
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: 
WOS
WOS32
TÃTULO: Teaching microelectronic-based integrated systems design and test
AUTORES: Gonçalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: 1999 IEEE International Conference on Microelectronic Systems Education, MSE 1999 in Proceedings - 1999 IEEE International Conference on Microelectronic Systems Education: Systems Education in the 21st Century, MSE 1999
AUTORES: Gonçalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: 1999 IEEE International Conference on Microelectronic Systems Education, MSE 1999 in Proceedings - 1999 IEEE International Conference on Microelectronic Systems Education: Systems Education in the 21st Century, MSE 1999
INDEXADO EM: 
Scopus
Scopus33
TÃTULO: LAYOUT-LEVEL TECHNIQUES FOR TESTABILITY IMPROVEMENT OF MOS PHYSICAL DESIGNS
AUTORES: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLICAÇÃO: 1991, FONTE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
AUTORES: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLICAÇÃO: 1991, FONTE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
INDEXADO EM: WOS
WOS34
TÃTULO: High-quality physical designs of CMOS ICs
AUTORES: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1991, FONTE: Euro ASIC 1991 in Euro ASIC 1991
AUTORES: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1991, FONTE: Euro ASIC 1991 in Euro ASIC 1991
INDEXADO EM: Scopus
Scopus