S. Muhl
AuthID: R-00G-0C5
1
TÃTULO: Ion beam analysis of TiN/Ti multilayers deposited by magnetron sputtering Full Text
AUTORES: Andrade, E; Flores, M; Muhl, S; Barradas, NP ; Murillo, G; Zavala, EP; Rocha, MF;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4
AUTORES: Andrade, E; Flores, M; Muhl, S; Barradas, NP ; Murillo, G; Zavala, EP; Rocha, MF;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4
