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TÍTULO: Effect of pre-implanted oxygen in Si on the retention of implanted He  Full Text
AUTORES: Manuaba, A; Paszti, F; Ramos, AR ; Khanh, NQ; Pecz, B; Zolnai, Z; Tunyogi, A; Szilagyi, E;
PUBLICAÇÃO: 2006, FONTE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, NÚMERO: 1-2 SPEC. ISS.
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