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TÍTULO: Soft x-ray free electron laser microfocus for exploring matter under extreme conditions  Full Text
AUTORES: Nelson, AJ; Toleikis, S; Chapman, H; Bajt, S; Krzywinski, J; Chalupsky, J; Juha, L; Cihelka, J; Hajkova, V; Vysin, L; Burian, T; Kozlova, M; Faeustlin, RR; Nagler, B; Vinko, SM; Whitcher, T; Dzelzainis, T; Renner, O; Saksl, K; Khorsand, AR; Heimann, PA; Sobierajski, R; Klinger, D; Jurek, M; Pelka, J; Iwan, B; Andreasson, J; Timneanu, N; Fajardo, M ; Wark, JS; Riley, D; Tschentscher, T; Hajdu, J; Lee, RW; ...Mais
PUBLICAÇÃO: 2009, FONTE: OPTICS EXPRESS, VOLUME: 17, NÚMERO: 20
INDEXADO EM: Scopus WOS CrossRef