S. J. Webb
AuthID: R-00G-HPT
1
TÃTULO: Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD Full Text
AUTORES: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2
AUTORES: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2
