Stefan Sch?Che
AuthID: R-00G-RMY
1
TÃTULO: Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN
AUTORES: Stefan Schöche; Tino Hofmann; Nebiha Ben Sedrine; Vanya Darakchieva; Xinqiang Wang; Akihiko Yoshikawa; Mathias Schubert;
PUBLICAÇÃO: 2012, FONTE: MRS Proc. - MRS Proceedings, VOLUME: 1396
AUTORES: Stefan Schöche; Tino Hofmann; Nebiha Ben Sedrine; Vanya Darakchieva; Xinqiang Wang; Akihiko Yoshikawa; Mathias Schubert;
PUBLICAÇÃO: 2012, FONTE: MRS Proc. - MRS Proceedings, VOLUME: 1396
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