N. Wyrsch
AuthID: R-00J-4YM
1
TÃTULO: Measurement of surface photovoltage in high-rate deposited a-Si:H films and comparison with photothermal deflection spectroscopy and conductivity data Full Text
AUTORES: Schwarz, R; Goedecker, S; Muschik, T; Wyrsch, N; Shah, AV; Curtins, H;
PUBLICAÇÃO: 1987, FONTE: Journal of Non-Crystalline Solids, VOLUME: 97-98, NÚMERO: PART 1
AUTORES: Schwarz, R; Goedecker, S; Muschik, T; Wyrsch, N; Shah, AV; Curtins, H;
PUBLICAÇÃO: 1987, FONTE: Journal of Non-Crystalline Solids, VOLUME: 97-98, NÚMERO: PART 1
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